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2019 Materials science lecture series: advanced materials - 11 January 2019

2019 Materials science lecture series: advanced materials - 11 January 2019

Jan 11, 2019 - 10.00 uur

Universiteit Hasselt

campus Diepenbeek

Agoralaan Gebouw D

3590 Diepenbeek

Lokaal Room H1


Mevrouw Aslihan BABAYIGIT



MRS/E-MRS joint chapter of Hasselt University: 2019 materials science lecture series: advanced materials.

Speaker: Prof. Alexander Welle, Karlsruher Insitut für Technology (KIT) Institut für Funktionelle Grenzflächen, Institut für Technische Chemie und Polymerchemie, Karlsruhe Nano Micro Facility - Germany

Time-of-flight secondary ion mass spectroscopy

Friday 11 January 2019, 10:00

Room H11, Building D, Hasselt University, Campus Diepenbeek.


Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful surface analysis tool allowing for high sensitivity, imaging of patterns down to the sub μm range, and wide applicability for materials ranging from metals, semiconductors, polymers and organic layers, to peptides, lipids and other biomolecules. For this analysis, samples are brought into ultra-high vacuum and are bombarded with a pulsed high energy primary ion beam (Bi, or small Bi-clusters). Sputtered secondary ions are extracted, mass separated and counted. Usually, the probing depth is a few nm only, and analyses can be performed in a quasi-static mode, with negligible sample destruction. To reach buried layers, a dual beam depth profiling is performed using an additional high-current beam of Cs+, O2 +, or Argon-clusters to erode the sample even with maintaining molecular structures. Thereby, depth profiles and 3D tomograms are obtained.

The technology will be introduced; the applications and limitations will be discussed based on numerous examples. Offered by the Karlsruhe Nano Micro Facility researchers can get access to this analytical technology amongst several others. New collaborations are welcome!