Detailed information can be found in the brochure.
X-ray diffraction (XRD) is a non-destructive technique to reveal crystallographic information about materials such as bulk materials, thin films and powders. With powder XRD the crystal structure of materials (original or on purpose in powder form) is gathered. The XRD studies upon bulk materials and films allow besides the definition of the crystal structure also other crystallopgraphic information as preferential orientation, residual stress, … Combination of the XRD equipment with a temperature chamber under a controlled atmosphere allows the study of phase transformations, oxidation reactions,….
Besides the above mentioned modes based upon the diffraction of X-rays on crystalline materials, also X-ray reflectometry (XRR) measurements can be performed on the same equipment. Such XRR measurements are used to determine the thickness, roughness and density of films. The XRR technique is applicable on crystalline and amorphous layers.