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SCANNING ACOUSTIC MICROSCOPY

Detailed information can be found in the brochure.

 

Scanning Acoustic Microscopy (SAM) is a nondestructive technique that uses a focused ultrasonic acoustic beam to scan the device under test. Ultrasound waves are transmitted through the device and the deflections from the different interfaces within the material are monitored. From the reflected pulses an image of the inside of the device is constructed.

A large variety of uses for Scanning Acoustic Microscopy can be found in the automotive industry. One of the more common uses of SAM systems in the automotive industry is the inspection of microelectronic devices.

Different components like switches, sensors, power devices, board mounted devices or discrete components can be inspected to perform failure analysis, vendor qualification control, reliability and process control. Different internal device discontinuities like cracks, delaminations and voids are easily spotted using SAM.