Detailed information can be found in the brochure.
Transmission electron microscopy (TEM) is an imaging technique where a beam of electrons is passing through a thin specimen (typically hundred nm thick). Depending from the nature of the thin specimen (density, crystal structure, defects,…) a different amount of electrons will pass through. The transmitted electrons will form after magnification an image or diffraction pattern on the recording medium (fluorescent screen or CCD camera).
Despite the drawback of mostly the tedious specimen preparation, the TEM technique is very powerful due to the information which can be obtained at a very small scale (lateral resolution of some tenths of a nm in imaging mode). Especially the combination of imaging mode (BF : bright field; DF : dark field), diffraction mode and chemical composition obtained by EDX (Energy dispersive X-ray detection) is very powerful.