Project R-14079

ELECTRICAL SCANNING PROBE MICROSCOPY (eSPM) – Advanced nanoscale morphological and multifunctional electrical characterization in controlled environment for the study of solar cells to biological materials (Research)

ELECTRICAL SCANNING PROBE MICROSCOPY (eSPM) allows to perform combined local morphological/electrical characterization at the nanoscale and includes techniques such as Conductive Atomic Force Microscopy (C-AFM), Electrostatic Force Microscopy (EFM), and Kelvin Probe Force Microscopy (KPFM), which is extremely powerful and versatile for a high-resolution topographic, nanoelectrical and nanomechanical study of a very broad range of materials, ranging from molecular and biological structures to electronic and energy applications such as transistors, solar cells and batteries.

07 July 2023 - 06 July 2027